Are you collecting data on more things than ever before? Are you able to measure more of the attributes of your system, store and retain this data? Is some of your data measured on a more frequent basis than other system attributes?  Are you left wondering how to exploit the potential hidden value in your data?

See how statistical modelling can help explore, identify and exploit key relationships in your data – and simultaneously increase your knowhow about what is actually going on. By joining this webinar, you will gain an appreciation of how statistical modelling helps:

  • Generate deeper insight and ideas from your data.
  • Attain deeper understanding of products and processes when some of the variables are measured at higher frequencies than others.
  • Achieve better outcomes from your data.
  • Save time and increase your effectiveness.

Hadley Myers

Hadley Myers is a Sr. Systems Engineer for JMP currently supporting users in the UK and Ireland. Holding a PhD in Electrical Engineering from McGill University (Montreal, Canada), he has over 15 years of research and industry experience and is the author of 30 technical publications.

Register now for this free webinar.

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