Basic
Diving into Accelerated Life Testing for Product Reliability
Live Webinar:
29 November 2024 | 11:00 GMT (12:00 CET)
Presenter :
Owen Jonathan
Accelerated Life Testing (ALT) is required for the evaluation of product reliability for parts that need to perform well for long periods. Due to low failure rates at use conditions, parts must be tested at high stress levels to generate failures in a reasonable amount of time. Devices requiring such reliability analyses include medical devices, semiconductor circuits, aviation equipment and more. See how to analyze accelerated test data to predict lifetimes at use conditions for both single and multiple constant stresses tests, along with ramped stress tests.
Examine a safe operating area using contour plots. See a 30-minute demo followed by 15-30 minutes of Topic Discussion and Q&A.