Data Analysis Software for the Semiconductor Industry
How JMP® Empowers the Semiconductor Industry
All 25 of the world's top semiconductor companies use JMP.
For integration and product management
- Quickly identify potential yield improvements in new and existing products.
- Reduce waste and excursion recovery with data-driven root cause analysis investigations.
- Easily create interactive wafer maps.
- Quickly get the information you need to meet customer requirements through efficient split plans.
- Efficiently shape broad collections of data into actionable insights.
- Present compelling data insights to decision makers and customers.
For process and equipment engineering
- Qualify and release new process tools into production faster, with fewer errors.
- Design experiments to develop robust new recipes and tune existing ones.
- Increase speed and quality of analyses by automating routine tasks.
- Easily create interactive wafer maps.
- Quickly identify and troubleshoot drifts or failures.
- Efficiently monitor processes to ensure consistent quality.
For reliability
- Quickly design test plans and define needed sample sizes.
- Accurately simulate and forecast failure rates.
- Present results interactively to decision makers.
- Create time-to-failure models that are dependent on multiple factors, such as process, voltage, temperature and frequency.
For yield and quality
- Quickly develop reports and visualizations to better identify issues before they become excursions.
- Quickly develop efficient data collection plans to help guide investigations.
- Guide root cause analysis investigations more efficiently using machine learning and AI models.
- Easily create interactive wafer maps.
- Efficiently manage and manipulate diverse data sets from a wide variety of sources.
260%
boost in job satisfaction among engineers
Vishay
“Continuously delivering value to the company – that’s what JMP® can do.”
Seagate
83%
improved process capability index
Polar Semiconductor
JMP Capabilities for the Semiconductor Industry
Design of Experiments (DOE)
Create custom experimental series to maximize the information you get from each wafer.
Definitive Screening Design
Optimize your process faster by getting more information out of each experimental lot than you have before.
Data Mining
Leverage machine learning, AI and classic data mining techniques to find hidden insights and quickly identify potential root causes of problems.
Data Visualization
JMP links dynamic graphics with powerful statistics to interactively share findings. Explore your data without leaving the analysis flow or having to rerun commands as new questions arise.
Quality and Capability Analysis
Leverage the Process Screening platform in JMP – our quality dashboard – to quickly determine which variables require attention and identify out-of-control events before they become excursions.
Explore Patterns
Investigate data integrity by more efficiently identifying unexpected patterns in data, even with large data sets.
