1.
Select Help > Sample Data Library and open Wafer Stacked.jmp.
2.
Select Analyze > Clustering > Hierarchical Cluster.
3.
In the list in the lower left corner, change Data as usual to Data is stacked.
4.
Select Defects and click Y, Columns.
5.
Select X_Die and Y_Die and click Attribute ID.
6.
Select Lot and Wafer and click Object ID.
7.
Select Add Spatial Measures from the list of options in the lower left corner.
Completed Clustering Launch Window
8.
Spatial Components Window
Because Defects is measured at 1423 locations, there are 1423 Attributes variables.
9.
Click OK to accept the selections in the Spatial window.
Cluster Summary Report

Help created on 9/19/2017