Interval-Censored Accelerated Failure Time Model

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Reliability and Survival Methods • Fit Parametric Survival • Additional Examples of Fitting Parametric Survival • Interval-Censored Accelerated Failure Time Model

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Interval-Censored Accelerated Failure Time Model

The ICdevice02.jmp data shows failures that were found to have happened between inspection intervals. The model uses two y-variables, containing the upper and lower bounds on the failure times. Right-censored times are shown with missing upper bounds.

Note: The data in ICdevice02.jmp comes from Meeker and Escobar (1998, p. 640).

Select Help > Sample Data Library and open Reliability/ICdevice02.jmp.

Select Analyze > Reliability and Survival > Fit Parametric Survival.

Select HoursL and HoursU and click Time to Event.

Select Count and click Freq.

Select x and click Add.

Click Run.

Figure 14.12 ICDevice Output

The resulting regression shows a plot of time by degrees.

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Help created on 3/19/2020