The ICdevice02.jmp data shows failures that were found to have happened between inspection intervals. The model uses two y-variables, containing the upper and lower bounds on the failure times. Right-censored times are shown with missing upper bounds.
Note: The data in ICdevice02.jmp comes from Meeker and Escobar (1998, p. 640).
1. Select Help > Sample Data Library and open Reliability/ICdevice02.jmp.
2. Select Analyze > Reliability and Survival > Fit Parametric Survival.
3. Select HoursL and HoursU and click Time to Event.
4. Select Count and click Freq.
5. Select x and click Add.
6. Click Run.
Figure 14.12 ICDevice OutputĀ
The resulting regression shows a plot of time by degrees.