This example uses the Failures.jmp sample data table, which contains failure data and a frequency column. It lists causes of failure during the fabrication of integrated circuits and the number of times each type of defect occurred for two processes. A constant sample size of 1000 is specified for this example.
1. Select Help > Sample Data Library and open Quality Control/Failures.jmp.
2. Select Analyze > Quality and Process > Pareto Plot.
3. Select Causes and click Y, Cause.
4. Select Process and click X, Grouping.
5. Select Count and click Freq.
6. Select Per Unit Analysis and then select Constant.
7. Enter 1000 in Sample Size.
8. Click OK.
Figure 13.10 Pareto Plot Report Window
Process A indicates Contamination as the top failure while Process B indicates Oxide Defect as the leading failure.
9. Click the Pareto Plot red triangle and select Count Analysis > Test Rates Across Groups.
Figure 13.11 Test Rates across Groups Results
Note that the DPU for Contamination across groups (Process A and B) is around 0.06.