You can create multiple control charts in the same window using the New Y Chart option in the interactive workspace or by specifying multiple processes in a specific control chart launch window. In this example, use the I/MR control chart launch window and then save the control limits to a new data table.
1. Select Help > Sample Data Library and open Semiconductor Capability.jmp.
2. Select Analyze > Quality and Process > Control Chart > IMR Control Chart.
3. Click the triangle next to Processes to show all of the processes.
4. Select the first five processes and click Y.
5. Click OK.
If you scroll through the report window, there are Individual and Moving Range control charts for all five selected processes. Since the processes have a Spec Limits column property, there are also Process Capability Analysis reports for each process.
6. Click the Control Chart Builder red triangle and select Save Limits > in New Tall Table.
Figure 3.32 New Tall TableĀ
The control limits are saved to a new data table, with a row for each Y variable and a column for each statistic.