Example of the Fit Life by X Platform
This example uses the Devalt.jmp sample data table, from Meeker and Escobar (1998), and can be found in the Reliability folder of the sample data. It contains time-to-failure data for a device at accelerated operating temperatures. No time-to-failure observation is recorded for the normal operating temperature of 10 degrees Celsius; all other observations are shown as time-to-failure or censored values at accelerated temperature levels of 40, 60, and 80 degrees Celsius.
1. Select Help > Sample Data Library and open Reliability/Devalt.jmp.
2. Select Analyze > Reliability and Survival > Fit Life by X.
3. Select Hours and click Y, Time to Event.
4. Select Temp and click X.
5. Select Censor and click Censor.
6. Leave the Censor Code as 1.
7. Select Weight and click Freq.
8. Keep Arrhenius Celsius as the relationship, and keep the Nested Model Tests option selected.
9. Select Weibull as the distribution.
10. Keep Wald as the confidence interval method.
Figure 4.2 Fit Life by X Launch Window
11. Click OK.
Figure 4.3 Fit Life by X Report Window for Devalt.jmp Data
The report window shows summary data, diagnostic plots, comparison data and results, including detailed statistics and prediction profilers. Separate result sections are shown for each selected distribution. Distribution, Quantile, Hazard, Density, and Acceleration Factor Profilers are included for each of the specified distributions.