For the latest version of JMP Help, visit JMP.com/help.


Quality and Process Methods > Measurement Systems Analysis
Publication date: 11/10/2021

Measurement Systems Analysis

Evaluate a Continuous Measurement Process Using the EMP Method

The Measurement Systems Analysis (MSA) platform assesses the precision, consistency, and bias of a measurement system. Before you can study the process itself, you need to make sure that you can accurately and precisely measure the process. If most of the variation that you see comes from the measuring process itself, then you are not reliably learning about the process. Use MSA to find out how your measurement system is performing.

This chapter covers the EMP method. The Gauge R&R method is described in Variability Gauge Charts.

Figure 4.1 Example of a Measurement System Analysis 

Example of a Measurement System Analysis

Contents

Overview of Measurement Systems Analysis

Example of Measurement Systems Analysis

Launch the Measurement Systems Analysis Platform

Data Format

Measurement Systems Analysis Platform Options

Average Chart
Range Chart or Standard Deviation Chart
EMP Results
Effective Resolution
Shift Detection Profiler
Bias Comparison
Test-Retest Error Comparison

Additional Example of Measurement Systems Analysis

Statistical Details for Measurement Systems Analysis

Computation of Intraclass Correlation and Probable Error
Want more information? Have questions? Get answers in the JMP User Community (community.jmp.com).