JMP 13.2 Online Documentation (English)
Discovering JMP
Using JMP
Basic Analysis
Essential Graphing
Profilers
Design of Experiments Guide
Fitting Linear Models
Predictive and Specialized Modeling
Multivariate Methods
Quality and Process Methods
Reliability and Survival Methods
Consumer Research
Scripting Guide
JSL Syntax Reference
JMP iPad Help
JMP Interactive HTML
Capabilities Index
JMP 12 Online Documentation
Profilers
•
Simulator
• Defect Profiler
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Defect Profiler
The defect profiler shows the probability of an out-of-spec output defect as a function of each factor, while the other factors vary randomly. This is used to help visualize which factor’s distributional changes the process is most sensitive to, in the quest to improve quality and decrease cost.
Specification limits define what is a defect, and random factors provide the variation to produce defects in the simulation. Both need to be present for a Defect Profile to be meaningful.
At least one of the Factors must be declared Random for a defect simulation to be meaningful, otherwise the simulation outputs would be constant. These are specified though the simulator Factor specifications.
Important:
If you need to estimate very small defect rates, use
Normal weighted
instead of just
Normal
. This allows defect rates of just a few parts per million to be estimated well with only a few thousand simulation runs.
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Help created on 9/19/2017