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This example uses the Failure3.jmp sample data table, which contains the common causes of failure during the fabrication of integrated circuits. Examine the causes of failure and when it occurs.
1.
Select Help > Sample Data Library and open Quality Control/Failure3.jmp.
2.
Select Graph > Legacy > Treemap.
3.
Select N and click Sizes.
4.
Select failure and clean and click Categories.
5.
Select clean and click Coloring.
6.
Figure 11.18 Failure Modes
From Figure 11.18, you observe the following:

Help created on 3/19/2020