The Semiconductor Capability.jmp sample data table contains 128 columns of process measurements. Each column contains 1,455 measurements. You are interested in identifying unstable processes. Also, each column contains a Spec Limits column property. If a process is stable, it is appropriate to calculate its process capability. You proceed to assess both stability and capability for this data table.
1.
Select Help > Sample Data Library and open Semiconductor Capability.jmp.
2.
Select Analyze > Screening > Process Screening.
3.
Select the Processes column group and click Process Variables.
4.
Figure 18.2 Partial View of Initial Report
6.
Right-click the selected processes and select Quick Graph for Selected Items.
Figure 18.3 Quick Graphs for Highest Alarm Rate Processes
You decide to take a closer look at IVP8 (row 3, column 1 in the Graphs of Selected Items).
8.
Right-click the selected process and select Control Charts for Selected Items.
Figure 18.4 Control Chart Builder Report for IVP8
A Control Chart Builder report appears. Because IVP8 has a Spec Limits column property, the report also includes a capability analysis.

Help created on 7/12/2018