JMP 14.0 Online Documentation (English)
Discovering JMP
Using JMP
Basic Analysis
Essential Graphing
Profilers
Design of Experiments Guide
Fitting Linear Models
Predictive and Specialized Modeling
Multivariate Methods
Quality and Process Methods
Reliability and Survival Methods
Consumer Research
Scripting Guide
JSL Syntax Reference
JMP iPad Help
JMP Interactive HTML
Capabilities Index
JMP 13 Online Documentation
JMP 12 Online Documentation
Reliability and Survival Methods
• Cumulative Damage
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Cumulative Damage
Model Product Deterioration with Variable Stress over Time
Cumulative damage models, which include step-stress models, enable you to analyze an accelerated life test where the stress levels might be changed over time. The stress can be applied by many different forces: load, temperature, pressure. A typical cumulative damage experiment consists of multiple test units. Each unit has an initial stress level, and the stress level can be changed throughout the experiment. The response is the failure time or time-to-event. The platform plots the failure events and enables you to fit multiple distributions to your data.
Figure 4.1
Example of Cumulative Damage Report
Contents
Overview of the Cumulative Damage Platform
Example of the Cumulative Damage Platform
Launch the Cumulative Damage Platform
Time to Event
Stress Pattern
The Cumulative Damage Report
Event Plot
Stress Patterns Report
Model List
Model Results
Cumulative Damage Platform Options
Stress Patterns Options
Additional Example of the Cumulative Damage Platform
Example of Simulating New Data
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Help created on 7/12/2018