This example uses the Failure.jmp sample data table, which contains failure data and a frequency column. It lists causes of failure during the fabrication of integrated circuits and the number of times each type of defect occurred. From the analysis, you can determine which factors contribute most toward process failure.
1.
Select Help > Sample Data Library and open Quality Control/Failure.jmp.
2.
Select Analyze > Quality and Process > Pareto Plot.
3.
Select failure and click Y, Cause.
4.
Select N and click Freq.
5.
Figure 11.2 Pareto Plot Report Window
6.
Select Label Cum Percent Points from the red triangle menu next to Pareto Plot.
7.
From the red triangle menu, deselect Label Cum Percent Points and Show Cum Percent Curve.
9.
In the Maximum field, type 15.
In the Increment field, type 2.
In the Axis Label Row panel, select Grid Lines for the Major grid line.
Figure 11.3 Pareto Plot with Display Options
Figure 11.3 shows the counts of different types of failures and has a category legend. The vertical count axis is rescaled and has grid lines at the major tick marks.
Figure 11.4 Pareto Plot as a Pie Chart

Help created on 7/12/2018