JMP 14.0 Online Documentation (English)
Discovering JMP
Using JMP
Basic Analysis
Essential Graphing
Profilers
Design of Experiments Guide
Fitting Linear Models
Predictive and Specialized Modeling
Multivariate Methods
Quality and Process Methods
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Consumer Research
Scripting Guide
JSL Syntax Reference
JMP iPad Help
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Capabilities Index
JMP 13 Online Documentation
JMP 12 Online Documentation
Quality and Process Methods
• Measurement Systems Analysis
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Measurement Systems Analysis
Evaluate a Continuous Measurement Process Using the EMP Method
The Measurement Systems Analysis (MSA) platform assesses the precision, consistency, and bias of a measurement system. Before you can study the process itself, you need to make sure that you can accurately and precisely measure the process. If most of the variation that you see comes from the measuring process itself, then you are not reliably learning about the process. Use MSA to find out how your measurement system is performing.
This chapter covers the EMP method. The Gauge R&R method is described in the
Variability Gauge Charts topic
.
Figure 7.1
Example of a Measurement System Analysis
Contents
Overview of Measurement Systems Analysis
Example of Measurement Systems Analysis
Launch the Measurement Systems Analysis Platform
Measurement Systems Analysis Platform Options
Average Chart
Range Chart or Standard Deviation Chart
EMP Results
Effective Resolution
Shift Detection Profiler
Bias Comparison
Test-Retest Error Comparison
Additional Example of Measurement Systems Analysis
Statistical Details for Measurement Systems Analysis
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Help created on 7/12/2018