To use the Add Spatial Measures option, your data must be stacked and contain two attribute columns that correspond to spatial coordinates. Some spatial measures are constructed using the Hough transform. See White et al. (2008) and Ballard (1981). See Example of Wafer Defect Classification Using Spatial Measures.
The variables that identify which rectangle an object is in, where you specify the numbers of horizontal and vertical positions of objects in the rectangle. The term shot is used in semiconductor wafer data to identify which dies are imaged together across a wafer.