JMP 13.2 Online Documentation (English)
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JMP 12 Online Documentation
Design of Experiments Guide
• The Fit Two Level Screening Platform
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The Fit Two Level Screening Platform
Analyze Data from Screening Experiments
The Fit Two Level Screening platform is a modeling platform that you can use to analyze experimental data that results from a screening design. The Fit Two Level Screening platform helps you select a model by identifying effects that have a large impact on the response.
The Fit Two Level Screening platform is based on the principle of effect sparsity (Box and Meyer, 1986). This principle asserts that relatively few of the effects that you study in a screening design are active. Most are inactive, meaning that their true effects are zero and that their estimates are random error.
A screening design often provides no degrees of freedom for error. Consequently, classical tests for effects are not available. In such cases, the Fit Two Level Screening platform is particularly useful.
Half Normal Plot from Fit Two Level Screening Report
Contents
Overview of the Fit Two Level Screening Platform
An Example Comparing Fit Two Level Screening and Fit Model
Launch the Fit Two Level Screening Platform
The Screening Report
Contrasts
Half Normal Plot
Using the Fit Model Platform
Additional Fit Two Level Screening Analysis Examples
Analyzing a Plackett-Burman Design
Analyzing a Supersaturated Design
Technical Details
Order of Effect Entry
Fit Two Level Screening as an Orthogonal Rotation
Lenth’s Pseudo-Standard Error
Lenth t-Ratios
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Help created on 9/19/2017