JMP 14.0 Online Documentation (English)
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JMP 13 Online Documentation
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Quality and Process Methods
• V-Mask CUSUM Control Charts
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V-Mask CUSUM Control Charts
Use a V-Mask to Detect Small Shifts in the Process Mean
CUSUM charts show cumulative sums of subgroup or individual measurements from a target value. CUSUM charts can help you decide whether a process is in a state of statistical control by detecting small, sustained shifts in the process mean. In comparison, Shewhart charts can detect sudden and large changes in measurement, such as a two or three sigma shift, but they are less effective at spotting smaller changes, such as a one sigma shift.
Figure 5.1
Example of a V-Mask CUSUM Chart
Contents
Overview of V-Mask CUSUM Control Charts
Example of a V-Mask CUSUM Chart
Launch the V-Mask CUSUM Control Chart Platform
The V-Mask CUSUM Control Chart
Interpret a Two-Sided V-Mask CUSUM Chart
Interpret a One-Sided CUSUM Chart
V-Mask CUSUM Control Chart Platform Options
Example of a One-Sided CUSUM Chart
Statistical Details for V-Mask CUSUM Control Charts
One-Sided CUSUM Charts
Two-Sided CUSUM Charts
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Help created on 7/12/2018